WebIONTOF GmbH LinkedInのフォロワー数622人。Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a … WebTOF.SIMS 5 features and accessories. - Sample size up to 100 mm and 300 mm. - Wide range of ion sources (Bi n, O 2, Ar, Xe, Cs, Ar n, Ga) - Extended dynamic range of up to seven orders of magnitude. - Temperature controlled heating and cooling of the sample during the analysis and sample transfer. - Fast sample rotation during depth profiling.
Sr. Field Service Engineer - IonToF USA, Inc - LinkedIn
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Comparison of attributes of LEIS, ToF-SIMS, and XPS.
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